Publications

A novel energy resolved X-ray computed tomography instrument for aviation security: Preliminary metrological investigation

Sloth, Steffen ; Quagliotti, Danilo ; De Chiffre, Leonardo ; Christensen, Morten ; Poulsen, Henning F.
part of: European Society for Precision Engineering and Nanotechnology, Conference Proceedings, pages: 395-398, 2023
Presented at: 23rd International Conference of the European Society for Precision Engineering and Nanotechnology

Type: Article in proceedings (Peer reviewed)

Status: Published | Year: 2023

Opportunities and challenges of implementing energy dispersive x-ray CT in aviation security screening

Sloth, Steffen ; Olsen, Ulrik Lund ; Quagliotti, Danilo ; De Chiffre, Leonardo ; Christensen, Morten ; Poulsen, Henning Friis
in: E-Journal of Nondestructive Testing & Ultrasonics, vol: 28, issue: 3
Presented at: 12th Conference on Industrial Computed Tomography

Type: Conference article (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.58286/27708

Multiscale Exploration of Texture and Microstructure Development in Recrystallization Annealing of Heavily Deformed Ferritic Alloys

Yildirim, C. ; Mavrikakis, N. ; Cook, P. K. ; Lamas, R. Rodriguez ; Poulsen, H. F. ; Detlefs, C. ; Kutsal, M.
in: IOP Conference Series-Materials Science and Engineering, vol: 1249
Presented at: 42nd Risø International Symposium on Materials Science

Type: Conference article (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1088/1757-899X/1249/1/012044

The significance of the spectral correction of photon counting detector response in material classification from spectral x-ray CT

Jumanazarov, Doniyor ; Koo, Jakeoung ; Poulsen, Henning F. ; Olsen, Ulrik L. ; Iovea, Mihai
part of: Quantum Optics and Photon Counting 2021, 2021
Presented at: SPIE Optics + Optoelectronics 2021

Type: Article in proceedings (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1117/12.2589290

An application of multigrain approaches to the structural solution of grains from polycrystalline samples

Davaasambuu, J. ; Wright, J. ; Soerensen, H. O. ; Schmidt, S. ; Poulsen, H. F. ; Techert, S.
in: Solid State Phenomena, vol: 288, pages: 119-123
Presented at: 7th International Conference on Materials Science

Type: Conference article (Peer reviewed)

Status: Published | Year: 2019 | DOI: https://doi.org/10.4028/www.scientific.net/SSP.288.119

The ESRF dark-field x-ray microscope at ID06

Kutsal, M. ; Bernard, P. ; Berruyer, G. ; Cook, P. K. ; Hino, R. ; Jakobsen, A. C. ; Ludwig, W. ; Ormstrup, Jeppe ; Roth, T. ; Simons, Hugh ; Smets, K. ; Sierra, J. X. ; Wade, J. ; Wattecamps, P. ; Yildirim, C. ; Poulsen, Henning Friis ; Detlefs, C.
in: I O P Conference Series: Materials Science and Engineering, vol: 580, issue: 1
Presented at: 40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D

Type: Conference article (Peer reviewed)

Status: Published | Year: 2019 | DOI: https://doi.org/10.1088/1757-899X/580/1/012007

Insights into the Exceptional Crystallographic Order of Biominerals Using Dark-Field X-ray Microscopy

Cook, Phil K. ; Simons, Hugh ; Jakobsen, Anders Clemen ; Yildirim, Can ; Poulsen, Henning Friis ; Detlefs, Carsten
in: Microscopy and Microanalysis, vol: 24, issue: S2, pages: 88-89
Presented at: 14th International Conference on X-ray Microscopy

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2018 | DOI: https://doi.org/10.1017/S1431927618012837

In operando studies of an yttria stabilized zirconia electrolyte supported symmetric solid oxide cell by Dark field X-ray Microscopy at ID06

Sierra, J. X. ; Jørgensen, P. S. ; Poulsen, H. F. ; Detlefs, C. ; Cook, P. ; Simon, H. ; Bowen, J. R.
Presented at: ESRF User Meeting 2017

Type: Poster

Status: Published | Year: 2017

In operando studies of ScYSZ electrolyte supported symmetric solid oxide cell by X-ray Diffraction at ESRF, ID06 Beamline

Sierra, J. X. ; Poulsen, H. F. ; Jørgensen, P. S. ; Detlefs, C. ; Cook, P. ; Simons, H. ; Yildirim, C. ; Ahl, S. R. ; Jakobsen, A. C. ; Kantor, I. ; Bowen, J. R.
Presented at: 3rd International Conference on Tomography of 3D Materials and Structures

Type: Poster

Status: Published | Year: 2017

Multi-scale 3D characterization with dark-field x-ray microscopy

Simons, Hugh William ; Jakobsen, Anders Clemen ; Ahl, Sonja Rosenlund ; Cook, Phil K. ; Detlefs, Carsten ; Poulsen, Henning Friis
in: Acta Crystallographica. Section A: Foundations of Crystallography, vol: 73, pages: C852-C852
Presented at: 24th Congress and General Assembly of the International Union of Crystallography

Type: Conference abstract in journal (Peer reviewed)

Status: Published | Year: 2017 | DOI: https://doi.org/10.1107/S2053273317087228

Publikationer