Department of Physics

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ALL ARTICLE (235) DISSERTATION (2) BOOK (10) CONF (155) REPORT (2) MISC (5) PATENT (5) PEER REV (247)

2021

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X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRYSTALLINE MATERIALS

Poulsen, Henning Friis ; Olsen, Ulrik Lund
Patent no.: WO2021249940, Date: 2020-06-08

Type: Patent

Status: Published | Year: 2021

2019

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X-ray multigrain crystallography

Wejdemann, Christian ; Poulsen, Henning F ; Lauridsen, Erik M
Patent no.: US10139357, Date: 2016-08-04

Type: Patent

Status: Published | Year: 2019

2017

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A METHOD OF SECURITY SCANNING OF CARRY-ON ITEMS, AND A CARRY-ON ITEMS SECURITY SCANNING SYSTEM

Poulsen, Henning Friis ; Olsen, Ulrik Lund ; Kehres, Jan
Patent no.: WO2017005757, Date: 2017-01-12

Type: Patent

Status: Published | Year: 2017

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HIGH PRECISION COMPUTED TOMOGRAPHY FOR METROLOGY

Gundlach, Carsten ; Poulsen, Henning Friis
Patent no.: WO2017186804, Date: 2017-11-02

Type: Patent

Status: Published | Year: 2017

2012

X-ray diffraction contrast tomography (DCT) system, and an X-ray diffraction contrast tomography (DCT) method

Poulsen, Henning Friis ; Lauridsen, Erik Mejdal
Patent no.: WO2012003839, Date: 2012-01-12

Type: Patent

Status: Published | Year: 2012